Annuaire
J.S. Held publie ses perspectives sur les risques et les opportunités qui devraient avoir un impact sur les entreprises en 2025
En savoir plusDave Jack a rejoint J.S. Held en septembre 2023, au moment de l'acquisition par J.S. Held de TechPats. David is an experienced professional with over 15 years of expertise in failure analysis, reliability testing, and reverse engineering of integrated circuits and semiconductors across the United States, Canada, and Japan. He has utilized these skills to perform and direct analyses necessary for defining patent infringement of semiconductor devices and integrated circuit packaging. David has also contributed to research and development efforts to expand lab reverse engineering and testing capabilities. His experience extends to cable service provider equipment and systems testing, including TVs, set-top boxes, and video-on-demand systems.
David's extensive technical expertise and experience enable him to manage various reverse engineering activities across multiple technologies. These activities include imaging and teardown of consumer products, functional testing of electronics such as mobile phones, digital cameras, and televisions, and semiconductor imaging and materials analysis methods like Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM), Energy Dispersive X-ray Spectroscopy (EDS), and Electron Energy Loss Spectroscopy (EELS).
At J.S. Held, David focuses on patent-related reverse engineering and infringement analysis of consumer products, semiconductor processes, and packaging. He is also involved in project management and client development for various CPU architecture and power management technologies, as well as competitive intelligence analysis of cutting-edge semiconductor processes and packaging technologies.
David received a Master of Applied Science in Electrical Engineering and a Bachelor of Engineering in Engineering Physics from Carleton University, where he also received the Senate Medal for Outstanding Academic Achievement.
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